MAUD (Material Analysis using Diffraction)

Posted by mh329 at Sep 13, 2019 04:30 PM |
MAUD (Material Analysis using Diffraction) is a general diffraction/reflectivity analysis program mainly based on - but not limited to - the Rietveld method.

Availability

Help and training

License details

Version (Windows 10): 2.94
Supplier: University of Trento
Licence: University License
Restriction: For non-commercial use only. If a paper is published, cite MAUD use as described in license information.
Last updated: 13 July 2020

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