SEM

Scanning Electron Microscopy

Our Hitachi S-3600N Environmental Scanning Electron Microscope is capable of producing high-resolution digital images of the surface structure of specimens, which, by virtue of the large specimen chamber, can range from powdered material and microfossils to 25 cm diameter bulk samples.  A variable pressure mode allows the investigation of those non-conductive specimens which are not amenable to the application of a conductive coating.  An Oxford INCA 350 EDX system provides the capability for elemental mapping and analysis.

Contact

Ms Lin Marvin-Dorland

T: +44 (0)116 252 3780/1
E: lgm2@le.ac.uk

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