Transmission Electron Microscopy

JEOL JEM-2100 LaB6 TEM

In tansmission electron microscopy, a beam of electrons interacts with the sample as it passes through an ultra thin section which produces an image. The resolution is so great that it is possible to see individual atoms The main areas of use are in

  • cancer research
  • virology
  • materials analysis
  • pollution analysis
  • semiconducter research
  • nanotechnology

This TEM is equipped with STEM facilities and a Princeton Gamma Technology Avalon EDX system. 

TEM image
TEM Image
Instrument modes

  • TEM
  • Selected Area Diffraction
  • Convergent Beam Diffraction
  • STEM Bright Field
  • STEM Dark Field
  • EDS Probe
  • X - Ray Mapping (With PGT)
  • X - Ray Line Scan (With PGT)

Submit an enquiry

If you are unsure of your requirements, please submit an enquiry using the link above. We can offer bespoke testing parameters tailored to your needs.

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Contact Details

College of Science and Engineering
Physics Building
University of Leicester 
Leicester
LE1 7RH
Tel: 0116 252 3497 
Email: skh14@leicester.ac.uk