Our Hitachi S-3600N Environmental Scanning Electron Microscope is capable of producing high-resolution digital images of the surface structure of specimens, which, by virtue of the large specimen chamber, can range from powdered material and microfossils to 25 cm diameter bulk samples.  A variable pressure mode allows the investigation of those non-conductive specimens which are not amenable to the application of a conductive coating.  An Oxford INCA 350 EDX system provides the capability for elemental mapping and analysis.

Please contact Rob Wilson

Telephone: +44 (0)116 252 3932

Fax:           +44 (0)116 252 3918

e-mail:        rnw@le.ac.uk